Incident and transmitted light microscopes Panthera TEC MAT

Incident and transmitted light microscopes Panthera TEC MAT
Incident and transmitted light microscopes for science materials, inspection of semiconductor components, LCD displays and wafers, equipped with an intelligent brightfield / darkfield illumination concept. The microscope models with additionally integrated LED transmitted light expand the application options in the direction of complex composite materials.
-Tube type Siedentopf, swiveling
-Widefield oculars for spectacle wearers with diopter adjustment on both oculars
-CCIS® Plan Achromat & S-APO (PB free), DIN objectives
-Reversed coded nosepiece
-LED incident light illuminator with field and aperture diaphragm, with slots for polariser / analyser sliders
-With interchangeable illumination
-Motic LightTracer: Light memory, sleep mode (auto on-off), nosepiece LED light intensity and mode indicator
-Coaxial coarse and fine focusing system with tension adjustment
-Integrated power supply with sleep mode
-USB 2.0 for external camera power

Additional equipment depending on the model with bright field (transmitted light), segmentable dark field (reflected light), polarization (reflected light)

Scope of supply: Dust cover, power cord, allen key, screws for metal extension support
Specifications
Inclination Tube: 25°
Angle of rotation Tube: 360°
Eyepieces: Widefield UC-WF10X/22 mm
Nosepiece: Quintuple
Objectives: 5X/0.13 (AA 20.3 mm), 10X/0.25 (AA 17.5 mm), 20X/0.40 (AA 8.1 mm), S-Apo 50X/0.80 (AA 1 mm)
Interpupillary distance: 48 ... 75 mm
Condenser: LED condenser
Illumination: 3 W LEDs
Fine focus increment:
Focusing stroke: 2 µm
25 mm
Dimensions Stage (W x D): 300 x 180 mm
Dimensions (W x D x H): 410 x 300 x 450 mm
Net weight: 10,4 kg
Power supply: 110 ... 240 V, 50 / 60 Hz